Nanoparticels morphology in Al<sub>2</sub>O<sub>3</sub>/PI films studied by SAXS

LIU Xiaoxu1; 2 YIN Jinghua1; 3 YAN Kai2 CHENG Weidong4 WU Zhonghua4 1

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Nanoparticels morphology in Al₂O₃/PI films studied by SAXS

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- Nanoparticels morphology in Al₂O₃/PI films studied by SAXS
- NUCLEAR TECHNIQUES Vol. 32, Issue 12, (2009)
- 作者机构：
  
  1. 哈尔滨理工大学应用科学学院
  2. 黑龙江科技学院实训中心
  3. 工程电介质及其应用技术教育部重点实验室
  4. 中国科学院高能物理研究所多学科中心
- 作者简介：
- 基金信息：
  
  国家自然科学基金(50677009)资助
- DOI：
  CLC： TB383.1
- Published：01 December 2009
- 稿件说明：
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[1]刘晓旭,殷景华,闫凯,程伟东,吴忠华.Al_2O_3/PI薄膜纳米颗粒形态的SAXS研究[J].核技术,2009,32(12):901-904.

LIU Xiaoxu1, 2 YIN Jinghua1, 3 YAN Kai2 CHENG Weidong4 WU Zhonghua4 1. Nanoparticels morphology in Al₂O₃/PI films studied by SAXS[J]. Nuclear techniques, 2009, 32(12): 901-904.
[1]刘晓旭,殷景华,闫凯,程伟东,吴忠华.Al_2O_3/PI薄膜纳米颗粒形态的SAXS研究[J].核技术,2009,32(12):901-904. DOI：

LIU Xiaoxu1, 2 YIN Jinghua1, 3 YAN Kai2 CHENG Weidong4 WU Zhonghua4 1. Nanoparticels morphology in Al₂O₃/PI films studied by SAXS[J]. Nuclear techniques, 2009, 32(12): 901-904. DOI：

摘要

聚酰亚胺（PI）/无机纳米杂化材料具有良好的电绝缘性、优异的机械性能以及高耐热等特性

广泛地应用于电气电子领域。本文利用同步辐射小角X射线散射（SAXS）技术对聚酰亚胺纳米杂化薄膜（Al2O3/PI）进行微观结构分析

结合透射电子显微镜（TEM）测试的结果

研究了杂化薄膜中无机纳米颗粒的特性。研究结果表明

无机纳米颗粒尺寸约为4–7nm

纳米颗粒与基体之间具有明锐的界面

薄膜体系分形维数为2.48。

Abstract

Inorganic nanohybrid polyimide (PI) has wide applications in electric and electronics for its outstanding insulating

mechanical and heat-resistance properties.Al2O3/PI nanohybrid films of 100CR (Dupont)

with excellent corona-resistance

were characterized by synchrotron radiation small angle X-ray scattering (SAXS) and transmission electric microscopy (TEM).The results show that the inorganic particles are 4–7 nm in size.The interface between nanoparticles and matrix is sharp.Fractal dimension of the film is 2.48.

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Related Institution

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Nanoparticels morphology in Al2O3/PI films studied by SAXS

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摘要

Abstract

关键词

Keywords

references

Nanoparticels morphology in Al₂O₃/PI films studied by SAXS