HE Yujuan~1 SHI Qian~1 LUO Hongwei~1 EN Yunfei~1 ZHANG Xiaowen~1 LI Bin~2 LIU Yuan~. Effect of frequency of dynamic bias to total dose effect of X-rays[J]. Nuclear techniques, 2008, (1): 19-22.
HE Yujuan~1 SHI Qian~1 LUO Hongwei~1 EN Yunfei~1 ZHANG Xiaowen~1 LI Bin~2 LIU Yuan~. Effect of frequency of dynamic bias to total dose effect of X-rays[J]. Nuclear techniques, 2008, (1): 19-22.DOI:
Effect of frequency of dynamic bias to total dose effect of X-rays
Bias voltage applied to MOSFET during irradiation has a major impact on the device response because charge yield
transport
and trapping in oxide are all bias dependent.NMOSFET and PMOSFET under different fre- quency of dynamic bias were irradiated by 10 keV X-rays to study the total dose effect.The shifts of threshold volt- age of the MOSFETs before and after irradiation and effects of the radiation-induced charge on the threshold voltage of MOSFETs are analyzed in this paper.The results showed that the higher the frequency of pulse signal is
the less threshold shift and concentration of the radiation-induced charge were observed at the same pulsed voltage.