A new method in the calibration of AXUV-100 detectors

ZHANG Shaohua1; 2 LEI Jiarong2 ZHOU Rongsheng1 YUAN Yonggang2 WEI Xiye2 1

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A new method in the calibration of AXUV-100 detectors

更新时间：2021-03-12

- A new method in the calibration of AXUV-100 detectors
- NUCLEAR TECHNIQUES Issue 5, (2008)
- 作者机构：
  
  1. 成都理工大学核资源与自动化工程学院
  2. 核物理与化学研究所
  4. 核物理与化学研究所绵阳,621900
- 作者简介：
- 基金信息：
  
  教育部,高等学校博士学科点专项科研基金(20040616014)资助
- DOI：
  CLC： TN36
- Published：01 May 2008
- 稿件说明：
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[1]张少华,雷家荣,周蓉生,袁永刚,魏熙烨.硅光电二极管标定新技术[J].核技术,2008(05):352-355.

ZHANG Shaohua1, 2 LEI Jiarong2 ZHOU Rongsheng1 YUAN Yonggang2 WEI Xiye2 1. A new method in the calibration of AXUV-100 detectors[J]. Nuclear techniques, 2008, (5): 352-355.
[1]张少华,雷家荣,周蓉生,袁永刚,魏熙烨.硅光电二极管标定新技术[J].核技术,2008(05):352-355. DOI：

ZHANG Shaohua1, 2 LEI Jiarong2 ZHOU Rongsheng1 YUAN Yonggang2 WEI Xiye2 1. A new method in the calibration of AXUV-100 detectors[J]. Nuclear techniques, 2008, (5): 352-355. DOI：

摘要

设计了一个以钝化层厚度和耗尽层厚度为参数的简单模型

描述硅光电二极管的工作原理。在137Cs-661 keV的均匀高能γ场中

对AXUV-100G型硅光电二极管进行标定。并且将试验标定曲线与国外标定曲线进行对比

分析后发现用这种方法标定的探测器精度与国外标定精度接近。同时推导出利用这种半导体探测器测量低能X射线光子注量的计算公式。

Abstract

A simple model has benn developed to describe working principle of a silicon photodiode using thickness of the passivation and depletion layers as parameters.The AXUV-100 silicon photodiode was calibrated with 137Cs 661 keV γ-ray.The calibrated curve agrees well with the abroad calibrated curve.A formula can be applied to calculate fluence of low-energy X-ray photons impinging on this kind of silicon photodiode.

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