A testing system circuit for front-end ASIC of silicon strip detector

QIAN Yi1; 2 SU Hong1 XU Si jiu1; 2 LI Xiaogang1 1

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A testing system circuit for front-end ASIC of silicon strip detector

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- A testing system circuit for front-end ASIC of silicon strip detector
- NUCLEAR TECHNIQUES Issue 3, (2008)
- 作者机构：
  
  1. 中国科学院近代物理研究所
  2. 中国科学院近代物理研究所兰州730000 中国科学院研究生院北京,100049
- 作者简介：
- 基金信息：
  
  国家自然科学基金资助(10675153)项目
- DOI：
  CLC： TL81
- Published：01 March 2008
- 稿件说明：
移动端阅览
[1]千奕,苏弘,徐四九,李小刚.硅条探测器前端ASIC芯片测试系统电路设计[J].核技术,2008(03):229-232.

QIAN Yi1, 2 SU Hong1 XU Si jiu1, 2 LI Xiaogang1 1. A testing system circuit for front-end ASIC of silicon strip detector[J]. Nuclear techniques, 2008, (3): 229-232.
[1]千奕,苏弘,徐四九,李小刚.硅条探测器前端ASIC芯片测试系统电路设计[J].核技术,2008(03):229-232. DOI：

QIAN Yi1, 2 SU Hong1 XU Si jiu1, 2 LI Xiaogang1 1. A testing system circuit for front-end ASIC of silicon strip detector[J]. Nuclear techniques, 2008, (3): 229-232. DOI：

摘要

介绍一种前端读出专用集成电路（ASIC

Application-Specific Integrated Circuit）芯片性能测试系统的电路设计与实现。该ASIC芯片可用于构成硅微条探测器、硅条、Si（Li）和CsI探测器的前端读出电子学系统。本文详细描述了测试系统的构成

主要电路设计

系统应用以及部分测试结果

并简要介绍了被测ASIC芯片的电路结构。

Abstract

A testing system circuit we designed for front-end ASIC of Silicon strip detector is reported in this paper. This ASIC chip can also be used as the front-end electronics for silicon micro-strip

Si(Li) and CsI detectors. The circuit configuration of the test system

circuit design and testing results are described in details. Also

the architecture of the ASIC is introduced briefly.

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Design and implement of a test system for front-end ASIC chips

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Related Author

李小刚

马晓莉

董成富

孔洁

2 DONG Chengfu1 MA Xiaoli1 LI Xiaogang1 1

QIAN Yi1 SU Hong1 KONG Jie1

胡海龙

Signorini C

Related Institution

Institute of Modern Physics,Chinese Academy of Sciences,Lanzhou 730000, China) 2

中国科学院研究生院

China Institute of Atomic Energy

Institute of High Energy Physics, Chinese Academy of Sciences

Center of Nuclear Study, University of Tokyo

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