Sample preparation of HfF<sub>4</sub> for AMS

JIANG Tao1 YANG Tongzai1 QIU Jiuzi2 YANG Jun1 1

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Sample preparation of HfF₄ for AMS

更新时间：2021-03-12

- Sample preparation of HfF₄ for AMS
- NUCLEAR TECHNIQUES Issue 8, (2007)
- 作者机构：
  
  1. 中国工程物理研究院核物理与化学研究所
  2. 中国原子能科学研究院核物理研究所
- 作者简介：
- 基金信息：
  
  国家自然科学基金联合资助基金-NSAF联合基金资助(10576040)
- DOI：
  CLC： O657.63
- Published：01 August 2007
- 稿件说明：
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[1]姜涛,杨通在,仇九子,杨君.加速器质谱测量用HfF_4样品的制备研究[J].核技术,2007(08):660-664.

JIANG Tao1 YANG Tongzai1 QIU Jiuzi2 YANG Jun1 1. Sample preparation of HfF₄ for AMS[J]. Nuclear techniques, 2007, (8): 660-664.
[1]姜涛,杨通在,仇九子,杨君.加速器质谱测量用HfF_4样品的制备研究[J].核技术,2007(08):660-664. DOI：

JIANG Tao1 YANG Tongzai1 QIU Jiuzi2 YANG Jun1 1. Sample preparation of HfF₄ for AMS[J]. Nuclear techniques, 2007, (8): 660-664. DOI：

摘要

研究了用于加速器质谱（AMS）测量的HfF4样品的制备方法。通过分离纯化流程和HfF4的制备流程

将HfO2样品制成符合加速器质谱测量用的HfF4。流程去杂质能力很强

特别是对钨的去污

样品基本满足测量要求。全流程产额约为70%

对钨的去污系数约为106。

Abstract

Preparation method of HfF4 for Accelerator mass spectrometry(AMS) was studied. The HfO2 sample was transformed to HfF4 suited to AMS measurement through the purification flow and HfF4 preparation flow of HfF4.The decontamination coefficient of the purification flow is high

especially for tungsten. The sample is suitable to the measurement of AMS.The yield of the whole flow was about 70% for Hf. The decontamination coefficient for W was about 106.

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Related Author

杨亮

拓飞

杨君

杨通在

JIANG Tao1 YANG Tongzai1 YANG Jun1 TUO Fei2 YANG Liang1 1

姜山

王伟

李朝历

Related Institution

Institute of Nuclear Physics and Chemistry,China Academy of Engineering Physics,Mianyang 621900,China) 2

广西大学物理科学与工程技术学院

China Institute of Atomic Energy, Beijing 102413, China) 2

Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai 201800) 2

中国科学院研究生院

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Sample preparation of HfF4 for AMS

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摘要

Abstract

关键词

Keywords

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Sample preparation of HfF₄ for AMS