Computer simulation for synchrotron radiation based X-ray fluorescent microtomography

doi:null

您当前的位置：

首页 >

文章列表页 >

Computer simulation for synchrotron radiation based X-ray fluorescent microtomography

更新时间：2021-03-12

- Computer simulation for synchrotron radiation based X-ray fluorescent microtomography
- NUCLEAR TECHNIQUES Issue 1, (2007)
- 作者机构：
  
  中国科学院上海应用物理研究所,上海,201800
- 作者简介：
- 基金信息：
- DOI：
  CLC： O434.1
- Published：01 January 2007
- 稿件说明：
移动端阅览
[1]邓彪,余笑寒,徐洪杰.同步辐射微束X射线荧光CT的计算机模拟[J].核技术,2007(01):5-11.

Computer simulation for synchrotron radiation based X-ray fluorescent microtomography[J]. Nuclear techniques, 2007, (1): 5-11.
[1]邓彪,余笑寒,徐洪杰.同步辐射微束X射线荧光CT的计算机模拟[J].核技术,2007(01):5-11. DOI：

Computer simulation for synchrotron radiation based X-ray fluorescent microtomography[J]. Nuclear techniques, 2007, (1): 5-11. DOI：

摘要

同步辐射微束X射线荧光CT是一种能无损、高空间分辨和高灵敏地探测样品内部元素含量和分布的新技术

是在建的上海光源（SSRF）硬X射线微聚焦及应用光束线站可开展的实验方法之一。本文简要介绍了同步辐射微束X射线荧光CT的基本原理和实验技术发展

对同步辐射微束X射线荧光CT实验进行了计算机模拟

用滤波反投影算法（FBP）、代数重构算法（ART）和加吸收修正的FBP算法重构了模拟样品的图像。对各种重构方法得到的图像质量进行了分析和比较

讨论了其适用性。

Abstract

Synchrotron radiation based fluorescent microtomography (SR-XFMT) is a nondestructive technique for detecting elemental composition and distribution inside a specimen with high spatial resolution and sensitivity

and will be an optional experimental technique at SSRF hard X-ray micro-focusing beamline now under construction.In this paper

the principles and developments of SR-XFMT are briefly introduced.Computer simulation of SR-XFMT experiment is performed.The image of the simulated sample is reconstructed using Filtered Back Projection (FBP)

Algebraic Reconstruction Techniques(ART) and modified FBP with absorption correction.The qualities of the re-constructed images are analyzed and compared.The validity of these reconstruction techniques is discussed.

关键词

Keywords

references

Views

下载量

CSCD

Alert me when the article has been cited

提交

Tools

Publicity Resources

Emulation of synchrotron radiation high-resolution actinic review for EUV mask

Advances in applications of in situ synchrotron-based X-ray techniques in supercapacitor research

Simulation analysis of superlattice half-order peaks caused by oxygen octahedral rotation in perovskite oxides

Development of a grazing incidence X-ray diffractometer for BL02U2 at SSRF

Study of 20 Hz high spatial-temporal resolution monochromatic X-ray dynamic micro-CT

Related Author

SU Zijing

LIU Haigang

MENG Xiangyu

ZHANG Xiangzhi

ZHAO Bo

GUO Zhi

WANG Yong

TAI Renzhong

Related Institution

Shanghai Advanced Research Institute, Chinese Academy of Sciences

Shanghai Institute of Applied Physics, Chinese Academy of Sciences

ShanghaiTech University

University of Shanghai for Science and Technology

National Synchrotron Radiation Laboratory, University of Science and Technology of China

AI问答

Address：2019 Jialuo Road, Jiading, Shanghai, China Postal code：201800
Tel：021-39194977 Email：LHB@sinap.ac.cn
Technical support is provided by Beijing Founder electronics co., LTD 沪ICP备05005479号-1 京公网安备11010802024621
It is recommended to read the content of this site in Chrome&IE9+. Please switch to extreme mode in browser 360.
Cookies We use cookies to help provide and enhance our service and tailor content. By continuing, you agree to the use of cookies.
Total Visits：881139 Visits Today：666

⁰