GU Yuehua GAO Hengjing WANG Qi ZHAO Ling. Studies of DNA damage induced by synchrotron radiation soft X-rays using single cell gel electrophoresis[J]. Nuclear techniques, 2006, (7): 481-484.
GU Yuehua GAO Hengjing WANG Qi ZHAO Ling. Studies of DNA damage induced by synchrotron radiation soft X-rays using single cell gel electrophoresis[J]. Nuclear techniques, 2006, (7): 481-484.DOI:
Studies of DNA damage induced by synchrotron radiation soft X-rays using single cell gel electrophoresis
The DNA damage of wheat root tip cells induced by different doses (0—288 J·cm-2) of synchrotron radiation (SR) soft X-rays was measured by using the single-cell gel electrophoresis (SCGE) technique. The DNA removal in electrophoresis was observed and the results showed that 20%—92% of wheat root tip cells were damaged with the increase of radiation dose
and the DNA damage level (expressed by Tail Moment) was positively correlated with the dose of synchrotron radiation soft X-rays.