Total reflection XRF analysis of trace elements in Ni-electrolyte

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- Total reflection XRF analysis of trace elements in Ni-electrolyte
- NUCLEAR TECHNIQUES Issue 3, (2001)
- 作者机构：
  
  中国科学院近代物理研究所,兰州,730000
- 作者简介：
- 基金信息：
- DOI：
  CLC： O657.31
- Published：01 March 2001
- 稿件说明：
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[1]李振坤,王志国,郝冀方.镍电解液痕量元素的全反射X射线荧光分析[J].核技术,2001(03):199-204.

LI Zhenkun WANG Zhiguo HAO Jifang. Total reflection XRF analysis of trace elements in Ni-electrolyte[J]. Nuclear techniques, 2001, (3): 199-204.
[1]李振坤,王志国,郝冀方.镍电解液痕量元素的全反射X射线荧光分析[J].核技术,2001(03):199-204. DOI：

LI Zhenkun WANG Zhiguo HAO Jifang. Total reflection XRF analysis of trace elements in Ni-electrolyte[J]. Nuclear techniques, 2001, (3): 199-204. DOI：

介绍了全反射X射线荧光分析（TXRFS）技术在日常分析中的应用可行性。在一个被分析的镍电解液中

测出痕量元素Zn和Pb的浓度分别为 0 .1ng/μL和 3.5ng/μL。

The feasibility of applying total reflection X-ray fluorescence spectroscopy to the routine analysis was briefly discussed

and results show that the concentrations for trance elements Zn and Pb are 0.1ng/μL and 3.5ng/μL in one Ni-electrolyte analyzed.

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