A design for microscopic soft X-ray beamline with diffraction-limited focusing

XIAO Tiqiao

doi:null

您当前的位置：

首页 >

文章列表页 >

A design for microscopic soft X-ray beamline with diffraction-limited focusing

更新时间：2021-03-12

- A design for microscopic soft X-ray beamline with diffraction-limited focusing
- NUCLEAR TECHNIQUES Issue 7, (2001)
- 作者机构：
  
  上海同步辐射中心,上海,201800
- 作者简介：
- 基金信息：
- DOI：
  CLC： O434.1
- Published：01 July 2001
- 稿件说明：
移动端阅览
[1]肖体乔.一种近衍射限聚焦软X射线显微光束线光学设计[J].核技术,2001(07):547-552.

XIAO Tiqiao. A design for microscopic soft X-ray beamline with diffraction-limited focusing[J]. Nuclear techniques, 2001, (7): 547-552.
[1]肖体乔.一种近衍射限聚焦软X射线显微光束线光学设计[J].核技术,2001(07):547-552. DOI：

XIAO Tiqiao. A design for microscopic soft X-ray beamline with diffraction-limited focusing[J]. Nuclear techniques, 2001, (7): 547-552. DOI：

摘要

软Ｘ射线扫描显微术、显微谱学等方面的研究需要有纳米量级的聚焦光斑，在同步辐射光束线建造中实现Ｘ射线的衍射限聚焦十分重要。设计采用了具有较高相干通量的波荡器辐射光源，利用衍射光学元件波带板实现近衍射限成象。引入了冗余照明的概念，以保证成象元件的空间相干照明。充分考虑水平和垂直方向的相空间匹配问题，以提高输出通量。设计聚焦光斑尺寸５０ｎｍ，输出光通量可达１０９ｐｈｏｔｏｎｓ／ｓ· ０．１％ＢＷ。

Abstract

A focused beam in nanometer scale is important for soft X - ray scanning microscopy and microscopic spectroscopy. A plan has been proposed to realize diffraction - limited focusing of X - ray

during the construction of synchrotron radiation beamline. In this design

light source from undulator radiation

with high coherent flux

is employed. A zone plate

a kind of diffraction optical element

is used to focus the soft X - ray beam into diffraction - limited spot. A concept of redundant illumination is introduced to ensure the spatial coherent illumination of the imaging element. In order to improve the output

special consideration is posed to phase space matching in horizontal and vertical directions. The designed focus spot size is 50nm

flux output is 109photons/s·0. 1% BW.

关键词

Keywords

references

Views

下载量

CSCD

Alert me when the article has been cited

提交

Tools

Publicity Resources

Effect of toroidal mirror on spatial coherence of synchrotron hard X-ray beams

Emulation of synchrotron radiation high-resolution actinic review for EUV mask

Advances in applications of in situ synchrotron-based X-ray techniques in supercapacitor research

Simulation analysis of superlattice half-order peaks caused by oxygen octahedral rotation in perovskite oxides

Development of a grazing incidence X-ray diffractometer for BL02U2 at SSRF

Related Author

WANG Hua YAN Shuai YAN Fen MAO Chengwen LIANG Dongxu HE Yan JIANG Sheng LI Aiguo YU Xiaohan

闫帅

闫芬

毛成文

梁东旭

何燕

蒋升

李爱国

Related Institution

Shanghai Institute of Applied Physics,Shanghai Synchrotron Radiation Facility,Chinese Academy of Sciences

Shanghai Advanced Research Institute, Chinese Academy of Sciences

Shanghai Institute of Applied Physics, Chinese Academy of Sciences

ShanghaiTech University

University of Shanghai for Science and Technology

AI问答

Address：2019 Jialuo Road, Jiading, Shanghai, China Postal code：201800
Tel：021-39194977 Email：LHB@sinap.ac.cn
Technical support is provided by Beijing Founder electronics co., LTD 沪ICP备05005479号-1 京公网安备11010802024621
It is recommended to read the content of this site in Chrome&IE9+. Please switch to extreme mode in browser 360.
Cookies We use cookies to help provide and enhance our service and tailor content. By continuing, you agree to the use of cookies.
Total Visits：881003 Visits Today：530

⁰