LI Guishan ZHAO Youxin LIU Baolu ZHAO Langtao. Total dose effects testing techniques for 12 bit A/D converters[J]. Nuclear techniques, 2000, (10): 721-725.
LI Guishan ZHAO Youxin LIU Baolu ZHAO Langtao. Total dose effects testing techniques for 12 bit A/D converters[J]. Nuclear techniques, 2000, (10): 721-725.DOI:
Total dose effects testing techniques for 12 bit A/D converters
This paper described testing techniques with approved computer aided ADC characterization methods for both heavy ion and prompt gamma environments. The results show that measurements of dc parameters and linearity at major code transitions are adequate for evaluation of A/D reinforce designing
with considerable cost saving compared to full dynamic testing.