Half-life measurement of <sup>79</sup>Se with projectile X-ray method in AMS

HE Ming JIANG Songsheng JIANG Shan WU Shaoyong DIAO Lijun

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Half-life measurement of ⁷⁹Se with projectile X-ray method in AMS

更新时间：2021-03-12

- Half-life measurement of ⁷⁹Se with projectile X-ray method in AMS
- NUCLEAR TECHNIQUES Issue 1, (2004)
- 作者机构：
  
  1. 中国原子能科学研究院
  2. 中国原子能科学研究院,北京,102413
- 作者简介：
- 基金信息：
- DOI：
  CLC： O615
- Published：01 January 2004
- 稿件说明：
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[1]何明,蒋崧生,姜山,武绍勇,刁立军.利用加速器质谱学中的入射离子X射线方法测定~(79)Se的半衰期[J].核技术,2004(01):22-26.

HE Ming JIANG Songsheng JIANG Shan WU Shaoyong DIAO Lijun. Half-life measurement of ⁷⁹Se with projectile X-ray method in AMS[J]. Nuclear techniques, 2004, (1): 22-26.
[1]何明,蒋崧生,姜山,武绍勇,刁立军.利用加速器质谱学中的入射离子X射线方法测定~(79)Se的半衰期[J].核技术,2004(01):22-26. DOI：

HE Ming JIANG Songsheng JIANG Shan WU Shaoyong DIAO Lijun. Half-life measurement of ⁷⁹Se with projectile X-ray method in AMS[J]. Nuclear techniques, 2004, (1): 22-26. DOI：

摘要

利用加速器质谱学中的入射离子X射线方法（PX-AMS）对79Se的半衰期进行了测定。用这一直接测量79Se原子数的方法得到新的79Se半衰期为（2.80±0.36）×10

a。利用同样的方法也测定了75Se的半衰期

75Se半衰期的测定结果显示利用PX-AMS方法对79Se半衰期的测定结果是可靠的。

Abstract

The half-life of 79Se has been measured using the projectile X-ray method in AMS (PX-AMS). A new half-life of 79Se

(2.80±0.36) ×10~5a is obtained with the direct measurement method. The half-life of 75Se is also obtained with the same method as that of 79Se. The measurement result of 75Se half-life shows that the result of 79Se half-life obtained with the PX-AMS method is reliable.

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Half-life measurement of 79Se with projectile X-ray method in AMS

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摘要

Abstract

关键词

Keywords

references

Half-life measurement of ⁷⁹Se with projectile X-ray method in AMS