Anew diffraction-enhanced imaging set-up for large sample using synchrotron radiation X-ray

YUAN Qingxi TIAN Yulian ZHU Peiping HUANG Wanxia WANG Junyue HU Tiandou                                                      JIANG Xiaoming Wu Ziyu

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Anew diffraction-enhanced imaging set-up for large sample using synchrotron radiation X-ray

更新时间：2021-03-12

- Anew diffraction-enhanced imaging set-up for large sample using synchrotron radiation X-ray
- NUCLEAR TECHNIQUES Issue 10, (2004)
- 作者机构：
  
  1. 中国科学院高能物理研究所
  2. 中国科学院高能物理研究所,北京,100039
- 作者简介：
- 基金信息：
  
  国家自然科学基金重大子项目(10390014);中国科学院高能物理所科技创新经费资助课题
- DOI：
  CLC： O434.1
- Published：01 October 2004
- 稿件说明：
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[1]袁清习,田玉莲,朱佩平,黄万霞,王寯越,胡天斗,姜晓明,吴自玉.用于大尺寸样品的同步辐射硬X射线衍射增强成像方法研究[J].核技术,2004(10):725-728.

YUAN Qingxi TIAN Yulian ZHU Peiping HUANG Wanxia WANG Junyue HU Tiandou JIANG Xiaoming Wu Ziyu. Anew diffraction-enhanced imaging set-up for large sample using synchrotron radiation X-ray[J]. Nuclear techniques, 2004, (10): 725-728.
[1]袁清习,田玉莲,朱佩平,黄万霞,王寯越,胡天斗,姜晓明,吴自玉.用于大尺寸样品的同步辐射硬X射线衍射增强成像方法研究[J].核技术,2004(10):725-728. DOI：

YUAN Qingxi TIAN Yulian ZHU Peiping HUANG Wanxia WANG Junyue HU Tiandou JIANG Xiaoming Wu Ziyu. Anew diffraction-enhanced imaging set-up for large sample using synchrotron radiation X-ray[J]. Nuclear techniques, 2004, (10): 725-728. DOI：

摘要

作为 X 射线相衬成像的方法之一

衍射增强成像方法由于能获得较高的信噪比及分辨率而引起了人们的研究兴趣。北京同步辐射装置（BSRF）形貌学实验站也开展了该方法的探索研究。此前的衍射增强成像方法中

当白光 X 射线光束横截面尺寸为 20 mm×10 mm 时

经过双晶单色器后最大只能获得横截面尺寸为20 mm×4 mm 的均匀单色 X 射线

从而造成成像区域减小。在对通常衍射增强成像光路排列分析的基础上

提出了一种新的光学排列几何并进行了衍射增强实验。应用新光学排列几何首次获得了与入射白光 X 射线尺寸相当的、大的成像光斑均匀区域

因而新光学排列几何更适合于大尺寸样品的研究工作。同时

该光学排列几何成像分辨率可以达到微米量级并且更方便于实验操作。

Abstract

As a technique for X-ray phase contrast imaging

diffraction-enhanced imaging (DEI) attracts much interest for its high resolution and good image quality. Some research work has also been carried out at Beijing Synchrotron Radiation Facility (BSRF) during the past few years. In general DEI set-up

the obtainable image area is less than 20 mm×4 mm when cross section of the incident “white” X-ray beam is 20 mm×10 mm

which means general DEI set-up is deficient for large samples. Based on the analysis of general DEI set-up

a new set-up has been designed and applied in DEI experiments. In new DEI set-up

obtainable image area is for the first time as large as incident “white” X-ray beam. Resolution of image obtained using new DEI set-up is around the order of micrometer.

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Related Institution

Shanghai Institute of Applied Physics, Chinese Academy of Sciences

Research Center for Shanghai Synchrotron Radiation Facility, Shanghai Advanced Research Institute, Chinese Academy of Sciences

University of Chinese Academy of Sciences

School of Materials Science and Engineering,Dalian University of Technology,Dalian 116024,China) 2

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