Simulating study on systematic errors in measurements of high-current ion beam emittance with slit-wire method

ZOU Yubin GUO Zhiyu

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Simulating study on systematic errors in measurements of high-current ion beam emittance with slit-wire method

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- Simulating study on systematic errors in measurements of high-current ion beam emittance with slit-wire method
- NUCLEAR TECHNIQUES Issue 10, (2004)
- 作者机构：
  
  1. 北京大学重离子物理研究所
  2. 重离子物理教育部重点实验室
- 作者简介：
- 基金信息：
  
  国家自然科学基金重点项目(19835070)资助
- DOI：
  CLC： TL501
- Published：01 October 2004
- 稿件说明：
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[1]邹宇斌,郭之虞.缝丝法强流离子束发射度测量中系统误差的模拟研究[J].核技术,2004(10):744-748.

ZOU Yubin GUO Zhiyu. Simulating study on systematic errors in measurements of high-current ion beam emittance with slit-wire method[J]. Nuclear techniques, 2004, (10): 744-748.
[1]邹宇斌,郭之虞.缝丝法强流离子束发射度测量中系统误差的模拟研究[J].核技术,2004(10):744-748. DOI：

ZOU Yubin GUO Zhiyu. Simulating study on systematic errors in measurements of high-current ion beam emittance with slit-wire method[J]. Nuclear techniques, 2004, (10): 744-748. DOI：

摘要

本文分析了缝丝法测量强流离子束发射度时系统误差的主要来源

并用模拟计算的方法研究了不同误差来源所带来的误差大小。对于 rms 发射度测量

因缝采样、忽略缝宽和丝直径、以及空间电荷效应所引起的系统误差均可忽视

而短缝采样和设置较大的阈值则会引起显著的系统误差。

Abstract

The main sources of systematic errors in measurements of high-current ion beam emittance with slit-wire method are discussed. The errors with different sources were estimated by simulating the measuring process. For the measurements of rms emittance

the systematic errors due to sampling by slits

omitting the slit width and wire diameter as well as the space charge effect can be omitted. But the limitation of slit length and selecting a large threshold can cause significant systematic errors.

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