Grazing incidence X-ray diffraction study of La0.7Ca0.3MnO3 film

TAN Weishi~

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Grazing incidence X-ray diffraction study of La_0.7Ca_0.3MnO₃ film

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- Grazing incidence X-ray diffraction study of La_0.7Ca_0.3MnO₃ film
- NUCLEAR TECHNIQUES Issue 12, (2004)
- 作者机构：
  
  1. 南京理工大学理学院应用物理系
  2. 南京大学固体微结构物理国家重点实验室南京大学物理系
  3. 中国科学院高能物理研究所
  4. 香港大学物理系,南京,210094
  5. ,香港,中国
- 作者简介：
- 基金信息：
  
  国家自然科学基金(No.90201039,10474031,10174030);教育部博士点基金(No.20020284029)
- DOI：
  CLC： O484
- Published：01 December 2004
- 稿件说明：
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[1]谭伟石,蔡宏灵,吴小山,蒋树声,贾全杰,郭立平,何庆,高矩.La_(0.7)Ca_(0.3)MnO_3簿膜的掠入射X射线衍射研究[J].核技术,2004(12):914-918.

TAN Weishi~. Grazing incidence X-ray diffraction study of La_0.7Ca_0.3MnO₃ film[J]. Nuclear techniques, 2004, (12): 914-918.
[1]谭伟石,蔡宏灵,吴小山,蒋树声,贾全杰,郭立平,何庆,高矩.La_(0.7)Ca_(0.3)MnO_3簿膜的掠入射X射线衍射研究[J].核技术,2004(12):914-918. DOI：

TAN Weishi~. Grazing incidence X-ray diffraction study of La_0.7Ca_0.3MnO₃ film[J]. Nuclear techniques, 2004, (12): 914-918. DOI：

摘要

利用90°离轴射频磁控溅射方法将La

0.7

0.3

MnO

（LCMO）沉积于（001）取向的SrTiO

（STO）、MgO和α-Al

（ALO）单晶基片上

薄膜厚度均为500A。通过掠入射X射线衍射技术测量了LCMO薄膜的横向晶格常数（即面内晶格常数）

结合常规X射线衍射研究了LCMO薄膜的晶格应变及其弛豫情况。结果表明

LCMO薄膜在MgO和ALO基片上的应变弛豫临界厚度很小

这可能与薄膜—基片之间高的晶格失配率有关。LCMO薄膜的应变弛豫与四方畸变的弛豫可能具有不同的机制。利用掠入射X射线衍射对LCMO薄膜面内生长取向的研究给出了与利用电子显微技术研究相同的结果。

Abstract

0.7

0.3

MnO

（LCMO） thin films with the thickness of 500 A were deposited on（001）-oriented single crystal SrTiO

（STO）

MgO and α-Al

（ALO） by 90° off-axis radio frequency magnetron sputtering. Grazing incidence X-ray diffraction technique

associated with normal X-ray diffraction

was adopted to measure the in-plane lattice parameter and investigate the lattice strain and strain relaxation in LCMO films. The results indicate that critical thickness of strain relaxation is very small

which may be related to large mismatch between film and substrate. The mechanism for strain relaxation in LCMO film is perhaps different from that for tetragonal distortion. Furthermore

the in-plane growth orientation of LCMO film on STO and MgO was also studied by grazing incidence X-ray diffraction and the result is consistent with that from transmission electron microscopy.

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Related Author

TAN Weishi1

2 XU Jin2 CAI Hongling2 SHEN Bo2 WU Xiaoshan2 JIANG Shusheng2 ZHENG Wenli3 JIA Quanjie3 1

蔡宏灵

沈波

吴小山

蒋树声

郑文莉

贾全杰

Related Institution

Department of Applied Physics, Nanjing University of Science and Technology, Nanjing 210094) 2

南京大学固体微结构物理国家重点实验室南京大学物理系南京210093,南京210093,南京210093,南京210093,南京210093,南京210093,北京100039

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