An SEU rate prediction method for microprocessors of space applications

GAO Jie1; 2 LI Qiang3 1

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An SEU rate prediction method for microprocessors of space applications

更新时间：2021-03-05

- An SEU rate prediction method for microprocessors of space applications
- NUCLEAR TECHNIQUES Vol. 35, Issue 3, (2012)
- 作者机构：
  
  1. 上海交通大学电子与通信工程学院
  2. 上海航天技术研究院第八○四研究所
  3. 上海航天技术研究院第五○九研究所
- 作者简介：
- 基金信息：
- DOI：
  CLC： V446.9
- Published：01 March 2012
- 稿件说明：
移动端阅览
[1]高洁,李强.星用微处理器在轨单粒子翻转率预估方法研究[J].核技术,2012,35(03):201-205.

GAO Jie1, 2 LI Qiang3 1. An SEU rate prediction method for microprocessors of space applications[J]. Nuclear techniques, 2012, 35(3): 201-205.
[1]高洁,李强.星用微处理器在轨单粒子翻转率预估方法研究[J].核技术,2012,35(03):201-205. DOI：

GAO Jie1, 2 LI Qiang3 1. An SEU rate prediction method for microprocessors of space applications[J]. Nuclear techniques, 2012, 35(3): 201-205. DOI：

摘要

运用程序占空比概念及故障注入技术对星用微处理器动态和静态单粒子翻转率间的关系进行了研究

并将预估结果与国外在轨飞行监测数据进行了对比。结果表明

由程序占空比计算所得动态单粒子翻转率可对星用微处理器在轨单粒子翻转率进行合理预估;故障注入技术是灵活、方便的动态单粒子翻转率预估方法。

Abstract

In this article

the relationship between static SEU(Single Event Upset) rate and dynamic SEU rate in microprocessors for satellites is studied by using process duty cycle concept and fault injection technique.The results are compared to in-orbit flight monitoring data.The results show that dynamic SEU rate by using process duty cycle can estimate in-orbit SEU rate of microprocessor reasonable;and the fault injection technique is a workable method to estimate SEU rate.

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An SEU reliability prediction method for microprocessors of space applications

Related Author

LI Qiang1 GAO Jie2 LIU Weixin3 1

高洁

刘伟鑫

Related Institution

No.509 Institute,Shanghai Academy of Spaceflight Technology,Shanghai 200240,China) 2

上海航天技术研究院第804研究所

上海航天技术研究院第808研究所

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