Radiation effects on avionics microelectronics are important reliability issues for many space applications.In particular

single-event latchup(SEL) phenomenon is a major threat to CMOS integrated circuits in space systems.To effectively circumvent the failure

it is important to know the behavior of such devices during latchup.In this paper

the mechanisms for SEL in CMOS devices are investigated.Several microelectronic devices used in avionics are tested using heavy ion beams

pulsed laser and 252Cf source.Based on the SEL test results

SEL-hardening and monitoring methods for preventing SEL from the systems design level are proposed.