The development of a new digital BPM processor

LENG Yongbin Yi Xing LAI Longwei HUANG Guoqing; YAN Yingbing

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The development of a new digital BPM processor

更新时间：2021-03-05

- The development of a new digital BPM processor
- NUCLEAR TECHNIQUES Vol. 34, Issue 5, (2011)
- 作者机构：
  
  1. 中国科学院上海应用物理研究所
  2. 中国科学院核探测技术与核电子学重点实验室物理电子学安徽省重点实验室中国科学技术大学近代物理系
- 作者简介：
- 基金信息：
  
  中国科学院百人计划择优支持项目“先进加速器全信息束流诊断技术研究”、中国科学院知识创新工程重要方向性项目(KJCX2-YW-N27);国家自然科学基金(10875119)资助
- DOI：
  CLC： TP368.1
- Published：01 May 2011
- 稿件说明：
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[1]冷用斌,易星,赖龙伟,黄国庆,阎映炳,赵雷,严晗,陈凯,邬维浩,安琪.新型数字BPM信号处理器研制进展[J].核技术,2011,34(05):326-330.

LENG Yongbin Yi Xing LAI Longwei HUANG Guoqing, YAN Yingbing. The development of a new digital BPM processor[J]. Nuclear techniques, 2011, 34(5): 326-330.
[1]冷用斌,易星,赖龙伟,黄国庆,阎映炳,赵雷,严晗,陈凯,邬维浩,安琪.新型数字BPM信号处理器研制进展[J].核技术,2011,34(05):326-330. DOI：

LENG Yongbin Yi Xing LAI Longwei HUANG Guoqing, YAN Yingbing. The development of a new digital BPM processor[J]. Nuclear techniques, 2011, 34(5): 326-330. DOI：

摘要

介绍了采用Arm微处理器技术、FPGA数字信号处理技术、高速带通欠采样技术的新型BPM信号处理器研制进展情况;对两类主要的原理样机进行了评估测试。信号处理算法评估样机基于商业评估板搭建

用于测试包含数字下变频、低通滤波、抽取降速等信号处理算法功能模块。自主开发的硬件评估样机用于测试不同硬件功能模块及整机集成后的硬件性能。在上海光源储存环上进行的束流实验表明

两个样机的逐圈位置分辨率均好于2μm

可正确获取包含束流实时信息的逐圈位置信号

可用于相关机器研究。

Abstract

In this paper

we report our progresses in developing a new digital BPM signal processor

which is based on embedded ARM microcontroller

FPGA digital signal processing and high speed ADC with band pass under-sampling techniques.Two major prototypes have been evaluated.The first algorithm evaluation prototype is built using commercial development toolkits modules in order to test various digital processing blocks such as digital down converter(DDC)

low pass filter(LPF) and decimator.The second prototype is designed and fabricated from chips level in order to evaluate the hardware performances of different functional modules and assembled processor. The beam experiments carried on SSRF storage ring show that the turn-by-turn beam position resolution is better than 2μm for both prototypes.Acquired turn-by-turn beam position data contain the correct real-time beam information

being suitable for machine study.

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Shanghai Institute of Applied Physics, Chinese Academy of Sciences

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