Microstructure characterization of polyoctylfluorene thin film by using synchrotron grazing incident X-ray diffraction

CHEN Xi1; 2 CHENG Fengmei1 LI Haidong1 ZHANG Jidong2 1

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Microstructure characterization of polyoctylfluorene thin film by using synchrotron grazing incident X-ray diffraction

更新时间：2021-03-05

- Microstructure characterization of polyoctylfluorene thin film by using synchrotron grazing incident X-ray diffraction
- NUCLEAR TECHNIQUES Vol. 34, Issue 2, (2011)
- 作者机构：
  
  1. 长春工业大学化工工程学院
  2. 中国科学院长春应用化学研究所高分子物理与化学国家重点实验室
- 作者简介：
- 基金信息：
  
  国家自然科学基金(50803065,20990233)资助
- DOI：
  CLC： O484.5
- Published：01 February 2011
- 稿件说明：
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[1]陈曦,程凤梅,李海东,张吉东.同步辐射掠入射X射线衍射研究α相聚辛基芴薄膜的微结构[J].核技术,2011,34(02):139-142.

CHEN Xi1, 2 CHENG Fengmei1 LI Haidong1 ZHANG Jidong2 1. Microstructure characterization of polyoctylfluorene thin film by using synchrotron grazing incident X-ray diffraction[J]. Nuclear techniques, 2011, 34(2): 139-142.
[1]陈曦,程凤梅,李海东,张吉东.同步辐射掠入射X射线衍射研究α相聚辛基芴薄膜的微结构[J].核技术,2011,34(02):139-142. DOI：

CHEN Xi1, 2 CHENG Fengmei1 LI Haidong1 ZHANG Jidong2 1. Microstructure characterization of polyoctylfluorene thin film by using synchrotron grazing incident X-ray diffraction[J]. Nuclear techniques, 2011, 34(2): 139-142. DOI：

摘要

将旋涂制备的薄膜在120oC下退火

得到α相的聚辛基芴薄膜

用吸收光谱和荧光光谱进行了验证。用同步辐射一维和二维掠入射X射线衍射对薄膜进行了结构表征

结果表明

虽然聚辛基芴系非线型分子

但在薄膜微晶中分子链段主要以平行于基底的edge-on模式排列。

Abstract

Thin films of α phase polyoctylfluorene were prepared by thermal annealing spin-coating at 120oC

which is confirmed by absorption and photoluminescence spectra.The microstructure was characterized by using one-dimensional and two-dimensional grazing incident X-ray diffraction.The results show that molecular chain of the PFO is mainly parallel to the substrate with edge-on orientation.

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