Determination of scintillator PSF for measuring source transverse sizes of synchrotron radiations

YU Yingying LI Ming

doi:null

您当前的位置：

首页 >

文章列表页 >

Determination of scintillator PSF for measuring source transverse sizes of synchrotron radiations

更新时间：2021-03-05

- Determination of scintillator PSF for measuring source transverse sizes of synchrotron radiations
- NUCLEAR TECHNIQUES Vol. 34, Issue 6, (2011)
- 作者机构：
  
  中国科学院高能物理研究所
- 作者简介：
- 基金信息：
- DOI：
  CLC： O572.21
- Published：01 June 2011
- 稿件说明：
移动端阅览
[1]于滢潆,李明.同步辐射光源截面测量用闪烁体的点扩散函数测定[J].核技术,2011,34(06):423-426.

YU Yingying LI Ming. Determination of scintillator PSF for measuring source transverse sizes of synchrotron radiations[J]. Nuclear techniques, 2011, 34(6): 423-426.
[1]于滢潆,李明.同步辐射光源截面测量用闪烁体的点扩散函数测定[J].核技术,2011,34(06):423-426. DOI：

YU Yingying LI Ming. Determination of scintillator PSF for measuring source transverse sizes of synchrotron radiations[J]. Nuclear techniques, 2011, 34(6): 423-426. DOI：

摘要

在同步辐射光源截面测量的小孔成像系统中

要用闪烁体将X光转换成可见光

并在CCD上接收和成像。闪烁体会将投影在其上的点源扩大为一个弥散斑

即影响成像系统空间分辨率因素之一的闪烁体点扩散函数。利用刀口测定闪烁体对X光的边扩散函数来确定其点扩散函数

结合图像背景的扣除与沿刀口方向的边扩散函数的算术平均等处理方法

分别测定了100μm和200μm厚硅酸钇镥、200μm厚氟化钡

以及3 mm厚钨酸镉闪烁体的点扩散函数的FWHM

以此作为北京同步辐射光源截面测量小孔成像系统中所选择的闪烁体的设计依据。

Abstract

In an X-ray pinhole imaging system for measuring the source transverse size of synchrotron radiations

scintillators are used to convert X-rays into visible lights that can be received and imaged by CCD.However

the point source projected on the scintillators would be enlarged to a blur

which is the imaging system response to the point source

i.e.point spread function(PSF) of scintillators.PSF is a key factor to the imaging system resolution.By combining the noise deduction of images and the arithmetic average of the edge spread function along the knife edge

we developed a method to determinate PSF of scintillator

and obtained the PSFs(FWHM) of 100 and 200 μm thick LYSO

200 μm thick BaF2 and 3 mm thick CdWO4.The results will be refered in designing the X-ray pinhole imaging system at BSRF.

关键词

Keywords

references

Views

下载量

CSCD

Alert me when the article has been cited

提交

Tools

Publicity Resources

Geant4 simulation study of β-γ coincidence detector for ⁴¹Ar measurement

Simulation analysis of fast electron response of ZnS(Ag) scintillator in EAST

The effect of fast electrons on fast ion loss detector

Effect of photonic crystal prepared by different methods on the spatial resolution of scintillator-based synchrotron radiation imaging detector

Influence of scintillator’s thickness on imaging quality of lens-coupled hard X-ray imaging detector

Related Author

ZHANG Xinjun

FENG Yajie

ZHANG Ruiqin

NIU Yazhou

LI Qi

TONG Lili

WANG Shilian

ZHAO Yungang

Related Institution

CTBT Beijing National Data Centre and Beijing Radionuclide Laboratory

School of Mechanical Engineering, Shanghai Jiao Tong University

University of Science and Technology of China

Institute of Plasma Physics, Hefei Institutes of Physics Science, Chinese Academy of Sciences

Institute of Plasma Physics, Chinese Academy of Sciences

AI问答

Address：2019 Jialuo Road, Jiading, Shanghai, China Postal code：201800
Tel：021-39194977 Email：LHB@sinap.ac.cn
Technical support is provided by Beijing Founder electronics co., LTD 沪ICP备05005479号-1 京公网安备11010802024621
It is recommended to read the content of this site in Chrome&IE9+. Please switch to extreme mode in browser 360.
Cookies We use cookies to help provide and enhance our service and tailor content. By continuing, you agree to the use of cookies.
Total Visits：881214 Visits Today：741

⁰