There are two types of morphologies of crystalline GeO2: quartz type (q-GeO2) and rutile type (r-GeO2) . The former is a good piezoelectric and optical material and the latter is important in electronics. The melting points of the two kinds of GeO2 are different: 1115℃ for q-GeO2 while 1086℃ for r-GeO2. We proposed a method to overcome the difficulties in the XAFS measurements for oxide melts under high temperature and have collected the XAFS spectra with high quality for molten q-GeO2 and r-GeO2. The structures of different melts from different crystalline solids and their correlation have been discussed
especially for temperatures between the two melting points.