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XFT-84 microcomputer-based X-ray fluorescent coating thickness measurement instrument
更新时间:2022-09-13
    • XFT-84 microcomputer-based X-ray fluorescent coating thickness measurement instrument

    • Nuclear Techniques   Vol. 09, Issue 7, (1986)
    • Received:05 November 1985,

      Published:1986-07

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  • Jinxin Lin, Yuzheng Wang, Liren Jiang, et al. XFT-84 microcomputer-based X-ray fluorescent coating thickness measurement instrument[J]. Nuclear techniques, 1986, 09(7): 15-19,60. DOI:

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