Qiji Lai, Fengmei Wu, Yongxing Jiang, et al. Study of the radiation effects on MOS samples and Si diodes and triodes using: 10-12 MeV electron[J]. Nuclear techniques, 1986, 09(6): 14-18,59.

DOI：

Qiji Lai, Fengmei Wu, Yongxing Jiang, et al. Study of the radiation effects on MOS samples and Si diodes and triodes using: 10-12 MeV electron[J]. Nuclear techniques, 1986, 09(6): 14-18,59. DOI：