Determination of impurity in the ion beams of Van de Graaff accelerator

Songsheng Jiang; Yunfeng Cui; Qian Li; Xun Wang

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Determination of impurity in the ion beams of Van de Graaff accelerator

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- Determination of impurity in the ion beams of Van de Graaff accelerator
- Nuclear Techniques Vol. 09, Issue 2, (1986)
- 作者机构：
  
  中国原子能科学研究院
- 作者简介：
- 基金信息：
- DOI：
  CLC：
- Received：15 March 1984，
  
  Published：1986-02
- 稿件说明：
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Songsheng Jiang, Yunfeng Cui, Qian Li, et al. Determination of impurity in the ion beams of Van de Graaff accelerator[J]. Nuclear techniques, 1986, 09(2): 34-36,61.
DOI：

Songsheng Jiang, Yunfeng Cui, Qian Li, et al. Determination of impurity in the ion beams of Van de Graaff accelerator[J]. Nuclear techniques, 1986, 09(2): 34-36,61. DOI：

摘要

静电加速器广泛应用于离子的X射线分析、背散射、核反应和研究离子与物质的相互作用等等。静电加速器的离子由离子源产生，被端部高压进行加速。离子源所产生的离子往往不是很纯净的。为此，通常依靠磁分析器来排除那些被加速而又不需要的离子，并挑选出所需要的离子。但是，磁分析器要区分开那些荷质比相近的离子是十分困难的。在磁分析器所挑选出的离子束中，往往含有一些荷质比相近的其他离子。例如，在选择氘离子源的D

－

离子中伴随有

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http://html.publish.founderss.cn/rc-pub/api/common/picture?pictureId=34170924&type=

离子；相反在选择氢离子源的

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http://html.publish.founderss.cn/rc-pub/api/common/picture?pictureId=34170930&type=

http://html.publish.founderss.cn/rc-pub/api/common/picture?pictureId=34170927&type=

离子却伴随有D

离子。

离子中可能伴随

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http://html.publish.founderss.cn/rc-pub/api/common/picture?pictureId=34170938&type=

http://html.publish.founderss.cn/rc-pub/api/common/picture?pictureId=34170935&type=

和

离子。离子束中的杂质成分往往被人们所忽视，但在有些情况下，却是不容忽视的。例如，在利用D

离子分析表面氢含量时，D

离子束中含有

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http://html.publish.founderss.cn/rc-pub/api/common/picture?pictureId=34170946&type=

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离子就会直接影响到分析的灵敏度

[1]

；在研究

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http://html.publish.founderss.cn/rc-pub/api/common/picture?pictureId=34170952&type=

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离子与固体膜相互作用时

[2]

，

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http://html.publish.founderss.cn/rc-pub/api/common/picture?pictureId=34170955&type=

离子中含有的D

离子的数量大小也会影响到测量的精度；在背散射分析、离子溅射、辐照损伤研究以及核反应截面测量时，有时也不能忽视离子束中的杂质成分

[3]

。

Abstract

In this work Rutherford scattering technique was used to determine the unwanted accelerated ions which have the similar charge-mass ratio to the main required beam after the magnetic analyzer. The principle of this technique

the experimental arrangement

and determinations of

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http://html.publish.founderss.cn/rc-pub/api/common/picture?pictureId=34170958&type=

ions in the D

ion beam from deuterium ion source and D

ions in the

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http://html.publish.founderss.cn/rc-pub/api/common/picture?pictureId=34170966&type=

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ion beam from hydrogen ion source are described.

关键词

Keywords

references

郭清江等，核物理， 3 , 211 ( 1983 ).

H. J. Gaillard et al . , Nucl. Instr. Meth. , 132 , 69 ( 1976 ).

Y. C. Liu et al . , Nucl. Instr. Meth. , 152 , 349 ( 1978 ).

蒋崧生等，核技术， 6 , 8 ( 1984 ).

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