A thickness gauge used for measuring the gold plating layer

Anquan Le; Fasheng Han; Junquan Xu; Jieqing Zhu; Yingmei Gu

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A thickness gauge used for measuring the gold plating layer

更新时间：2022-09-13

- A thickness gauge used for measuring the gold plating layer
- Nuclear Techniques Vol. 08, Issue 9, (1985)
- 作者机构：
  
  中国科学院上海原子核研究所
- 作者简介：
- 基金信息：
- DOI：
  CLC：
- Received：27 June 1984，
  
  Published：1985-12
- 稿件说明：
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Anquan Le, Fasheng Han, Junquan Xu, et al. A thickness gauge used for measuring the gold plating layer[J]. Nuclear techniques, 1985, 08(9): 1-4,51.
DOI：

Anquan Le, Fasheng Han, Junquan Xu, et al. A thickness gauge used for measuring the gold plating layer[J]. Nuclear techniques, 1985, 08(9): 1-4,51. DOI：

摘要

本文简要介绍了仪器的测量原理和结构。仪器的测量厚度范围不大于10

m，测量精密度小于±0.5

m。

Abstract

The measurement principle and the construction of the thickness gauge used for measuring the gold plating layer was described. The measured range for the gold layer thickness is less than 10

m and the precision of measurement is better than ±0.5

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references

間金原粲著，杨希光泽，薄膜的基本技术，北京，科学出版社， 1982 年。

ASTM Designation, B567-79a .

American National Standard ASTM A754-79 .

张家骅等，放射性同位素X射线荧光分析，北京，原子能出版社， 1981 年，第 285 页.

徐君权等，用于X射线荧光分析的密封式正比计数管（核探测器和核电子学1979年会议资料汇编），北京，原子能出版社， 1982 年，第 111 页.

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