On-line radioisotope X-ray fluorescence instrument used for the thickness measurement of coating layer on tapes
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On-line radioisotope X-ray fluorescence instrument used for the thickness measurement of coating layer on tapes
Nuclear TechniquesVol. 08, Issue 5, (1985)
作者机构:
上海磁带厂
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Published:1985
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Jinglan Shen. On-line radioisotope X-ray fluorescence instrument used for the thickness measurement of coating layer on tapes[J]. Nuclear techniques, 1985, 08(5): 29-29,61.
DOI:
Jinglan Shen. On-line radioisotope X-ray fluorescence instrument used for the thickness measurement of coating layer on tapes[J]. Nuclear techniques, 1985, 08(5): 29-29,61.DOI:
On-line radioisotope X-ray fluorescence instrument used for the thickness measurement of coating layer on tapes