A charge sensitive preamplifier used in an X-ray semiconductor detector

Naizhang Huang; Zhiyong Li

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A charge sensitive preamplifier used in an X-ray semiconductor detector

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- A charge sensitive preamplifier used in an X-ray semiconductor detector
- Nuclear Techniques Vol. 06, Issue 5, (1983)
- 作者机构：
  
  核工业部北京核仪器厂
- 作者简介：
- 基金信息：
- DOI：
  CLC：
- Received：07 February 1983，
  
  Published：1983-10
- 稿件说明：
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Naizhang Huang, Zhiyong Li. A charge sensitive preamplifier used in an X-ray semiconductor detector[J]. Nuclear techniques, 1983, 06(5): 27-28,36,75,76.
DOI：

Naizhang Huang, Zhiyong Li. A charge sensitive preamplifier used in an X-ray semiconductor detector[J]. Nuclear techniques, 1983, 06(5): 27-28,36,75,76. DOI：

摘要

本文叙述了脉冲光反馈和电阻反馈两种方式的优缺点，并分析了电阻反馈中产生噪声的各项因素及减小噪声的方法。文中还引述了一种减小噪声斜率的办法。根据以上分析研制的前置放大器外接电容为零时的噪声为140~150eV，与硅锂探测器相配时，对Mn

线的能量分辨率为243eV。

Abstract

In this paper

advantages and disadvantages between the pulsed photo feedback and the resistance feedback are described. Causes of the noise in resistance feedback and measures taken to reduce noise are discussed. A way to reduce noise slope is described. A charge sensitive preamplifier is made based on the above analyses. The noise of the preamplifier is 140~150 eV with a source capacitance of 0 pF. The energy resolution of 243eV for MnK

X-ray is obtained when it is used with a Si (Li) semiconductor detector.

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references

D. A. Landis et al . , IEEE Trans. Nucl. Sci . , NS 18 , 1 , 115 （ 1971 ）.

ASTM , Energy dispersion X ray analysis , 1971 , p. 57 .

S. Desi , Nucl . Instr. Meth ., 70 , 1 , 57 （ 1969 ）.

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