Determination of stoichiometry of high temperature superconducting thin films by elastic backscattering of high energy ions
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Determination of stoichiometry of high temperature superconducting thin films by elastic backscattering of high energy ions
Nuclear TechniquesVol. 13, Issue 7, (1990)
作者机构:
复旦大学
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Received:17 November 1988,
Published:01 July 1990
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Huansheng Cheng, Fujia Yang, Guoqing Zhao, et al. Determination of stoichiometry of high temperature superconducting thin films by elastic backscattering of high energy ions[J]. Nuclear techniques, 1990, 13(7): 392-395.
DOI:
Huansheng Cheng, Fujia Yang, Guoqing Zhao, et al. Determination of stoichiometry of high temperature superconducting thin films by elastic backscattering of high energy ions[J]. Nuclear techniques, 1990, 13(7): 392-395.DOI:
Determination of stoichiometry of high temperature superconducting thin films by elastic backscattering of high energy ions
A technique for measuring stoichiometry of Y-Ba-Cu-O thin films with an accuracy of a few percent is described. This technique utilizes non-Rutherford backscattering of 8.8 MeV helium ions
which has an increased sensitivity for
16
O by a factor of 25 over Rutherford backscattering. The method is not only well suitable to Y-Ba-Cu-O thin film but also to Bi-Sr-Ca-Cu-O and T1-Ba-Ca-Cu-O thin films.
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references
承焕生 等 , 低温物理学报 , 9 ( 1987 ), 201 。
J. A. Martin et al . , Appl. Phys. Let. 52 ( 1988 ), 2177 .
J. F. Ziegler ed. , New uses of ion accelerators , Plenum Press , New York , p. 135 .