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兰州大学
Received:25 January 1988,
Published:01 January 1990
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Huazhong Yang, Hengxin Hao, Chengde Gong. Recovery of Si(Au) detectors exposed to fast neutron radiation[J]. Nuclear techniques, 1990, 13(1): 41-44.
DOI:
Huazhong Yang, Hengxin Hao, Chengde Gong. Recovery of Si(Au) detectors exposed to fast neutron radiation[J]. Nuclear techniques, 1990, 13(1): 41-44. DOI:
本文研究了探测器经注量
<
10
13
n/cm
2
的快中子辐照后,在重新加偏压过程中它们的反向电流猛增而使性能变坏的原因,然后采用慢加偏压的方式恢复了探测器的性能,延长了使用寿命。
The reason why Si (Au) detectors deteriorate when rebiasing after exposed to a fast neutron flux up to 10
is studied experimentally. By slowly applying the bias
the performance of the detectors could be recovered and their service life be prolonged.
复旦大学 等编 , 原子核物理实验方法,上册 , 原子能出版社 , 北京 , 1982 年, 第176页 。
邵明珠 等 , 核技术 ,( 1986 ), 9 : 12 .
D. I. Garber et al . , BNL - 325 , 1976 , p. 69 .
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