the slope of absorption curve is much larger in the range of thin-layer. By making use of this advantage: the thickness of a thin-layer absorber can be gauged with a high sensitivity.
The principle of the method and the experimental results are described. The correctness and the feasibility of the method have be verified in this work.
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references
E. P. Bertin , Principles and practice of X-ray spectrometric analysis , Plenum , 1970 .