A cross section electron microscopy was used to reexamine the structure of ion beam mixed Au/Si bilayers. The mixing was carried out with 150—300 keV Ar ion beams for dose (2—5.6) ×10
6
/cm
2
. Target temperature ranged from 150 to 373K. Some information on the fine structure at interfacial layers were obtained.
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references
B. Y. Tsaur and J. W. Mayer , Phil. Mag. , A43 ( 1981 ), 345 .
Von Allmen et al . , Appl. Phys. Lett. , 36 ( 1980 ), 207 .