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Electron beam irradiation damage test of electronic devices (CCD, PIN)
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    • Electron beam irradiation damage test of electronic devices (CCD, PIN)

    • Nuclear Techniques   Vol. 10, Issue 11, (1987)

    • Published：1987-11

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  • Xingfa Zhang, Zixiong Zhou. Electron beam irradiation damage test of electronic devices (CCD, PIN)[J]. Nuclear techniques, 1987, 10(11): 54-55. DOI：

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