A key-technique on analyzing trace element using XRF——standard curve of relative sensitivity

Jun Wang; Huade Cao; Qingbo Zhai; Meina Xue

您当前的位置：

首页 >

文章列表页 >

A key-technique on analyzing trace element using XRF——standard curve of relative sensitivity

更新时间：2022-08-16

- A key-technique on analyzing trace element using XRF——standard curve of relative sensitivity
- Nuclear Techniques Vol. 10, Issue 5, (1987)
- 作者机构：
  
  江苏省原子医学研究所
- 作者简介：
- 基金信息：
- DOI：
  CLC：
- Received：03 February 1986，
  
  Published：1987-05
- 稿件说明：
移动端阅览
Jun Wang, Huade Cao, Qingbo Zhai, et al. A key-technique on analyzing trace element using XRF——standard curve of relative sensitivity[J]. Nuclear techniques, 1987, 10(5): 14-16,22,60.
DOI：

Jun Wang, Huade Cao, Qingbo Zhai, et al. A key-technique on analyzing trace element using XRF——standard curve of relative sensitivity[J]. Nuclear techniques, 1987, 10(5): 14-16,22,60. DOI：

摘要

本文介绍用等量基体内标法将传统的内标法发展一步，成功地应用于各类不同基体的样品，以修正基体对元素分析产生的影响；又介绍一种曲线光滑技术——样条函数平滑数据法，使相对灵敏度因子的确定更趋准确可靠。最后用全国人发比对样品的数据来检验。

Abstract

A new equivalent base internal standard method was adopted to improve the traditional internal standard method

applied in different kinds of sample to correct the influence of different base material. The second part of this paper will describe an advanced curve smooth technique—smoothing spline function to make the determination of the relative sensitivity factor more reliable.

关键词

Keywords

references

王㑺等，核技术， 7 , 20 ( 1986 )。

C. H. Reinsch . Numerische Mathematik , 10 , 177 ( 1967 ).

С. H. Reinsch , Numerische Mathematik , 16 , 451 ( 1971 ).

张元勋，全国第二次人发中微量元素分析数据比对总结， 1985年全国第二次人发分析比对会议， 1985 年，泉州。

Views

下载量

CSCD

Alert me when the article has been cited

提交

Tools

Publicity Resources

Experimental studies of X-ray fluorescence excited by radioisotopes for trace element analysis

Related Author

Junmin Sun

Xin Zhang

Zhengfang Yin

Yaying Shen

Related Institution

No data

AI问答

Address：2019 Jialuo Road, Jiading, Shanghai, China Postal code：201800
Tel：021-39194977 Email：LHB@sinap.ac.cn
Technical support is provided by Beijing Founder electronics co., LTD 沪ICP备05005479号-1 京公网安备11010802024621
It is recommended to read the content of this site in Chrome&IE9+. Please switch to extreme mode in browser 360.
Cookies We use cookies to help provide and enhance our service and tailor content. By continuing, you agree to the use of cookies.
Total Visits：880565 Visits Today：92

⁰