A computer program used for calculating the thickness of multiple plating layers

Jieqing Zhu; Anquan Le; Yingmei Gu; Fasheng Han

您当前的位置：

首页 >

文章列表页 >

A computer program used for calculating the thickness of multiple plating layers

更新时间：2022-08-16

- A computer program used for calculating the thickness of multiple plating layers
- Nuclear Techniques Vol. 09, Issue 1, (1986)
- 作者机构：
  
  中国科学院上海原子核研究所
- 作者简介：
- 基金信息：
- DOI：
  CLC：
- Received：09 August 1984，
  
  Published：1986-01
- 稿件说明：
移动端阅览
Jieqing Zhu, Anquan Le, Yingmei Gu, et al. A computer program used for calculating the thickness of multiple plating layers[J]. Nuclear techniques, 1986, 09(1): 41-43,57,62.
DOI：

Jieqing Zhu, Anquan Le, Yingmei Gu, et al. A computer program used for calculating the thickness of multiple plating layers[J]. Nuclear techniques, 1986, 09(1): 41-43,57,62. DOI：

摘要

自从1974年西德H. Ebel[1]等人首先使用基本参数法X射线荧光分析技术绝对测量薄层厚度以来，已经有许多人在改进这项技术，并取得了进展

［2~5]

。使用这种方法可以不需要任何标准样品，非破坏性地绝对测量几乎任意材料组合的镀层厚度。但是这些方法都局限在单镀层，而在生产中常见的是复合镀层。如铜基上镀镍再镀金；铁基上镀铜再镀镍；黄铜上镀银再镀金等。对于复合镀层，美国R. J. Russell

[6]

在1977年研究了多层之间二次荧光对测量结果的影响。

Abstract

This paper describes a FORTRAN program used for absolute calculation of the thickness of multiple plating layers by means of X-ray fluorescence techniques

where the non-monoenergetic primary radiations and the second and the third fluorescence X-rays are considered.

关键词

Keywords

references

H. Etel et al . , X-Ray Spectrometry , 3 , 176 ( 1974 ).

S. G. Snow , Y - DA -6629 , 1976 .

D. Laguitton , X-Ray Spectrometry , 6 , 187 ( 1977 ).

T. Paradellis , Nucl. Instr. Meth. , 140 , 205 ( 1977 ).

乐安全等，核技术， 4 , 1 ( 1982 ).

R. J. Russell , BDX -613-1632 ( Rev ) , 1977 .

S. Sterlinski , Anal. Chem. , 42 , 151 ( 1970 ).

E. Storm and H. I. Israel , Nucl. Data Tables , A7 , 580 ( 1970 ).

Views

下载量

CSCD

Alert me when the article has been cited

提交

Tools

Publicity Resources

Absolute measurement of absorbed dose to water for γ-ray of ⁶⁰Co by water calorimetry

Preparation and absolute measurement of ¹⁴¹Ce standard solution

The TDCR method for activity standardization in liquid scintillation counting

Related Author

YANG Qian

FAN Jie

XU Shimeng

Ajin Zhao

yifen Yang

Yunxia Lan

Minyao Li

Zhangzhi Wang

Related Institution

National Institute of Measurement and Testing Technology

Institute of Atomic Energy

AI问答

Address：2019 Jialuo Road, Jiading, Shanghai, China Postal code：201800
Tel：021-39194977 Email：LHB@sinap.ac.cn
Technical support is provided by Beijing Founder electronics co., LTD 沪ICP备05005479号-1 京公网安备11010802024621
It is recommended to read the content of this site in Chrome&IE9+. Please switch to extreme mode in browser 360.
Cookies We use cookies to help provide and enhance our service and tailor content. By continuing, you agree to the use of cookies.
Total Visits：880523 Visits Today：50

⁰