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中国科学院上海原子核研究所
Received:04 March 1982,
Published:1983-08
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Tiaorong Zhang, Shouxin Chen, Zhiyi Zou, et al. Beam profile monitor and its application on the ion source test bench[J]. Nuclear techniques, 1983, 06(4): 27-30,75.
本文介绍束流截面监示仪的原理、结构和在离子源试验台上的实验结果及其优缺点。
本截面仪采用45°螺旋线探针。探针每旋转一周就给出了在两个互相垂直的方向上束截面的形状,也指明了束在束管中的位置和束流大小。束截面仪的使用给束的调节带来了方便。
本截面仪采用磁耦合静密封代替旋转密封,结构简单、使用方便。外形尺寸为
ϕ
120×180mm。
The principle and structure of the beam profile monitor and its experimental results on the ion source test bench are described. The magnetic-coupled static vacuum seal is used in the device to replace rotational vacuum seal. A 45° helix wire is used as a scanning probe. When the probe rotates a circle
the picture of the beam profile in two perpendicular directions is given
the position of the beam in the beam line and its intensity are also displayed. The dimensions of this device is 120mm in diameter and 180mm in length.
NEC , Model BPM6 beam profile monitor,说明书 .
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