在核物理、表面物理实验和半导体材料研究等工作中，往往要求对某个样品进行定向测量，然后对测得的数据进行分析。为了获得较精确的角度分布，必须对较多的角度点进行测量。实验时不断重复，占用较多实验人员的时间，因此十分需要解决自动测量问题，提高实验工作的效率。

An automatic control system with microprocessor is discussed. It is mainly used in channelling experiments for turning the target. Checking the beam current integrator and data acquisition in the multichannel analyser in order to let the experiment be carried on automatically.

A program is designed for selecting the turning angles

the number of repeated cycles

the measurement duration and so on. In this system a ET3400 microcomputer with a MOTOROLA 6800 microprocessor is used.