本文描述了用4π

x

（

LS

）-γ符合技术测定

67

Ga衰变率的精确方法〔不确定度±0.05%（3σ）〕。通过把

X

道的计数率外推到100%的效率和无限长的死时间，同时确定了子体

67

Zn亚稳态的半衰期和内转换跃迁强度。

In this paper an accurate method [with an uncertainty of ±0.5% (3σ) ] for determination of the disintegration rate of

67

Ga by

4πx

(

LS

) -

γ

coincidence is described. The half life and internal conversion transition intensity of

67

Zn (daughter of

67

Ga) were determinated simultaneously by extrapolating counting rate of the X channel to 100% efficiency and infinite dead time.